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2007

2006

2005

  1. Huang, J. C. A.*, and Hsu, C. Y. (2005). ac impedance techniques to study oxidation process of tunnel barriers in CoFe–AlO x–CoFe magnetic tunnel junctions. Journal of applied physics, 98(6), 064901.
  2. Huang, J. C. A.*, and Hsu, H. S. (2005). Inspection of magnetic semiconductor and clustering structure in CoFe-doped ZnO films by bias-dependent impedance spectroscopy. Applied physics letters, 87(13), 132503.
  3. Huang, J. C. A.*, Hsu, C. Y., Liao, Y. F., Lin, M. Z., and Lee, C. H. (2005). Role of interfacial roughness on bias-dependent magnetoresistance and transport properties in magnetic tunnel junctions. Journal of applied physics, 98(10), 103504.
  4. Hsu, C. Y., and Huang, J. C. A.* (2005). Characterization of interfacial properties in magnetic tunnel junctions by bias-dependent complex impedance spectroscopy. IEEE transactions on magnetics, 41(10), 3643-3645.
  5. Hu, Y. M.*, Huang, J. C. A., Chen, C. W., Lee, C. H., & Lin, M. J. (2005). Perpendicular magnetization of epitaxial CrPt x films. Journal of applied physics, 98(1), 013901.
  6. Hsu, H. S., Huang, J. C. A.*, Horng, L., Lee, C. H., Huang, Y. H., Liao, Y. F., and Lin, M. Z. (2005). Study of magnetic properties and local structures in discontinuous-CoFe-ZnO multilayers. IEEE transactions on magnetics, 41(2), 903-905.
  7. Su, H. C., Peir, J. J., Lee, C. H., Lin*, M. Z., Wu, P. T., Huang, J. C. A., and Tun, Z. (2005). The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni 80 Fe 20/Ru multilayers. Physica B: Condensed Matter, 357(1), 80-83.
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